28 lines
1.1 KiB
Markdown
28 lines
1.1 KiB
Markdown
# Grain Analysis
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Label connected grain regions in a binary mask and compute per-grain statistics: area, equivalent diameter, mean/max height, bounding box. Equivalent to Gwyddion's grain statistics tools.
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## Inputs
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| Name | Type | Required | Description |
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|------|------|----------|-------------|
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| field | DATA_FIELD | Yes | Height field providing z values for per-grain statistics |
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| mask | IMAGE | Yes | Binary mask defining grain regions (white = grain) |
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## Outputs
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| Name | Type | Description |
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|------|------|-------------|
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| grain_stats | DATA_TABLE | Per-grain table with area, equivalent diameter, mean/max height, bounding box, and centroid |
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## Controls
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| Name | Type | Default | Description |
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|------|------|---------|-------------|
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| min_size | INT | 10 | Minimum grain area in pixels; smaller connected regions are ignored (1–100000) |
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## Limitations
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- Grain detection uses 2D connected-component labeling on the binary mask; the field and mask must have the same pixel dimensions.
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- Physical area and diameter values require the field to carry valid physical calibration (xreal, yreal, si_unit_xy).
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