Grain Analysis
Label connected grain regions in a binary mask and compute per-grain statistics: area, equivalent diameter, mean/max height, bounding box. Equivalent to Gwyddion's grain statistics tools.
Inputs
| Name |
Type |
Required |
Description |
| field |
DATA_FIELD |
Yes |
Height field providing z values for per-grain statistics |
| mask |
IMAGE |
Yes |
Binary mask defining grain regions (white = grain) |
Outputs
| Name |
Type |
Description |
| grain_stats |
DATA_TABLE |
Per-grain table with area, equivalent diameter, mean/max height, bounding box, and centroid |
Controls
| Name |
Type |
Default |
Description |
| min_size |
INT |
10 |
Minimum grain area in pixels; smaller connected regions are ignored (1–100000) |
Limitations
- Grain detection uses 2D connected-component labeling on the binary mask; the field and mask must have the same pixel dimensions.
- Physical area and diameter values require the field to carry valid physical calibration (xreal, yreal, si_unit_xy).
